Size distribution of black spot defects and their contribution to swelling in irradiated SiC

JOURNAL OF NUCLEAR MATERIALS

卷:476

Article

Tyburska-Puschel, B.¹  Zhai, Y.²  He, L.²  Liu, C.²  Boulle, A.³  Voyles, P. M.²  Szlufarska, I.^1,2  Sridharan, K.¹ 

[1] Univ Wisconsin, Dept Engn Phys, 1500 Engn Dr, Madison, WI 53706 USA

[2] Univ Wisconsin, Dept Mat Sci, 1509 Univ Ave, Madison, WI 53706 USA

[3] Ctr Europeen Ceram, Sci Proc Ceram & Traitements Surface, CNRS UMR 7315, 12 Rue Atlantis, F-80768 Limoges, France

关键词: 4H-SiC;    Swelling;    Black spot defects;    XRD;    TEM;    Strain;    Ion-irradiation;    Carbon;    Krypton;   

DOI  :  10.1016/j.jnucmat.2016.04.044

来源: Elsevier

【 摘 要 】

Experimental and modeling efforts were combined to investigate the role of black spot defects (BSD) in swelling of carbon- and krypton -irradiated 4H-SiC. Samples were exposed to conditions favoring BSD formation: irradiation at temperatures 600-950 degrees C and damage levels of 0.4-0.8 dpa. The maximum XRD swelling values, corrected for the effect of the rigid substrate, of 0.58% for C and 0.75% for Kr irradiation were measured at the lowest irradiation temperature of 600 degrees C and decreased with increasing temperature. The swelling values estimated from TEM are on the same order of magnitude, but usually 40-70% lower than those measured by XRD. The contribution of BSDs to the overall swelling is 62% and the remainder of the swelling is caused by isolated point defects. The obtained results contribute to understanding of what defect types account for swelling and how their concentration evolves with the irradiation temperature and damage level. (C) 2016 Elsevier B.V. All rights reserved.

【 授权许可】

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