In situ study of heavy ion irradiation response of immiscible Cu/Fe multilayers

JOURNAL OF NUCLEAR MATERIALS

卷:475

Article

Chen, Y.^1,2  Li, N.²  Bufford, D. C.³  Li, J.¹  Hattar, K.³  Wang, H.^1,4  Zhang, X.^1,5,6 

[1] Texas A&M Univ, Dept Mat Sci & Engn, College Stn, TX 77843 USA

[2] Los Alamos Natl Lab, MPA CINT, POB 1663, Los Alamos, NM 87545 USA

[3] Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA

[4] Texas A&M Univ, Dept Elect & Comp Engn, College Stn, TX 77843 USA

[5] Texas A&M Univ, Dept Mech Engn, College Stn, TX 77843 USA

[6] Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA

关键词: In situ ion irradiation;    Heavy ion irradiation;    Immiscible interfaces;    Cu/Fe multilayers;    Size effect;   

DOI  :  10.1016/j.jnucmat.2016.04.009

来源: Elsevier

【 摘 要 】

Recent studies show that immiscible metallic multilayers with incoherent interfaces can effectively reduce defect density in ion irradiated metals by providing active defect sinks that capture and annihilate radiation induced defect clusters. Although it is anticipated that defect density within the layers should vary as a function of distance to the layer interface, there is, to date, little in situ TEM evidence to validate this hypothesis. In this study monolithic Cu films and Cu/Fe multilayers with individual layer thickness, h, of 100 and 5 nm were subjected to in situ Cu ion irradiation at room temperature to nominally 1 displacement-per-atom inside a transmission electron microscope. Rapid formation and propagation of defect clusters were observed in monolithic Cu, whereas fewer defects with smaller dimensions were generated in Cu/Fe multilayers with smaller h. Furthermore in situ video shows that the cumulative defect density in Cu/Fe 100 nm multilayers indeed varies, as a function of distance to the layer interfaces, supporting a long postulated hypothesis. (C) 2016 Elsevier B.V. All rights reserved.

【 授权许可】

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