Infrared spectroscopy of ion tracks in amorphous SiO2 and comparison to gamma irradiation induced changes

JOURNAL OF NUCLEAR MATERIALS

卷:514

Article

Karlusic, M.¹  Skrabic, M.²  Majer, M.¹  Buljan, M.¹  Skuratov, V. A.^3,4,5  Jung, H. K.⁶  Gamulin, O.²  Jaksic, M.¹ 

[1] Rudjer Boskovic Inst, Bijenicka Cesta 54, Zagreb 10000, Croatia

[2] Univ Zagreb, Sch Med, Salata 3, Zagreb 10000, Croatia

[3] Joint Inst Nucl Res, FLNR, Dubna, Russia

[4] Natl Res Nucl Univ MEPhI, Moscow, Russia

[5] Dubna State Univ, Dubna, Russia

[6] Korea Atom Energy Res Inst, Daejeon, South Korea

关键词: Swift heavy ion;    Ion track;    Thermal spike;    Amorphous SiO2;    Infrared spectroscopy;    Gamma rays;   

DOI  :  10.1016/j.jnucmat.2018.11.010

来源: Elsevier

【 摘 要 】

Ion track formation in amorphous SiO2 was investigated using infrared spectroscopy. For comparison, one set of samples was also irradiated using 1.25 MeV gamma rays. An increase of 1044 cm(-1) peak and decrease of 1078 cm(-1) peak was observed in all cases. Experimental results were analysed using an analytical thermal spike model and non-standard model parameters were found. This finding is attributed to the amorphous structure of the material. (C) 2018 Elsevier B.V. All rights reserved.

【 授权许可】

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