Nanostructure characterization of Co-Pd-Si-O soft magnetic nanogranular film using small-angle X-ray and neutron scattering

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS

卷:334

Article

Oba, Yojiro¹  Ohnuma, Masato¹  Ohnuma, Shigehiro²  Furusaka, Michihiro³  Koppoju, Suresh¹  Takeda, Shin³ 

[1] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, Japan

[2] Res Inst Electromagnet Mat, Sendai, Miyagi 9820807, Japan

[3] Hokkaido Univ, Sapporo, Hokkaido 0608628, Japan

关键词: Small-angle x-ray scattering;    Small-angle neutron scattering;    Nanogranular film;    Co;    Soft magnetic material;   

DOI  :  10.1016/j.jmmm.2013.01.024

来源: Elsevier

【 摘 要 】

The nanostructure of a Co-Pd-Si-O nanogranular film was investigated with the combined use of small-angle x-ray (SAXS) and neutron scattering (SANS). Using a new, compact type of SANS instrument, the SANS profiles of individual particles with a diameter of about 2-4 nm were successfully observed. The structures of magnetic regions were found to be the same as the chemical structures of the particles, and a sharp interface was observed between the matrix and the particles. The SAXS to SANS ratio clearly indicates that the particles are a CoPd alloy and the matrix is not pure SiO2. In fact, the matrix is composed of a meaningful amount of Co. (C) 2013 Elsevier B.V. All rights reserved.

【 授权许可】

Free