Magneto-ellipsometry as a powerful technique for investigating magneto-optical structures properties

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS

卷:440

Article; Proceedings Paper

Maximova, Olga^1,2  Kosyrev, Nikolay^1,4  Yakovlev, Ivan^1,3  Shevtsov, Dmitriy^1,3  Lyaschenko, Sergey^1,3  Varnakov, Sergey^1,3  Ovchinnikov, Sergey^1,2,3 

[1] RAS, SB, KSC, Kirensky Inst Phys,Fed Res Ctr, Krasnoyarsk 660036, Russia

[2] Siberian Fed Univ, Krasnoyarsk 660041, Russia

[3] Reshetnev Siberian State Aerosp Univ, Krasnoyarsk 660037, Russia

[4] Krasnoyarsk State Agr Univ, Achinsk Branch, Achinsk 662150, Russia

关键词: Magneto-optical Kerr effect;    Ellipsometry;    In situ measurements;   

DOI  :  10.1016/j.jmmm.2016.12.073

来源: Elsevier

【 摘 要 】

In this work we report on new magneto-ellipsometry set-up that allows to grow thin films and nanostructures by ultrahigh vacuum thermal evaporation as well as to conduct in situ measurements during the growth in order to analyze and control nanostructures properties. Ellipsometry and transverse magneto-optical Kerr effect measurements can be performed in situ inside this set-up. A uniform magnetic field of high intensity (more than 1 kOe) can be applied to samples inside the vacuum chamber. Also, we report on the developed method of data interpretation that is the base of the set-up software. Thus, we present a powerful tool for nanostructures synthesis and characterization.

【 授权许可】

Free