Separating the influence of electric charges in magnetic force microscopy images of inhomogeneous metal samples

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS

卷:446

Article

Arenas, Monica P.^1,2  Lanzoni, Evandro M.^3,4  Pacheco, Clara J.²  Costa, Carlos A. R.³  Eckstein, Carlos B.⁵  de Almeida, Luiz H.¹  Rebello, Joao M. A.¹  Deneke, Christoph F.⁶  Pereira, Gabriela R.^1,2 

[1] Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio de Janeiro, RJ, Brazil

[2] Lab Nondestruct Testing Corros & Welding, BR-21941596 Rio De Janeiro, RJ, Brazil

[3] Brazilian Nanotechnol Natl Lab, BR-18083970 Campinas, SP, Brazil

[4] Sao Paulo State Univ, UNESP, BR-18087180 Sorocaba, SP, Brazil

[5] Petrobras SA, BR-21040000 Rio De Janeiro, RJ, Brazil

[6] Univ Estadual Campinas, Gleb Wataghin Inst Phys, BR-13083859 Campinas, SP, Brazil

关键词: Austenitic stainless steels;    Aging;    Carbides;    Magnetic force microscopy;    Kelvin probe force microscopy;    Magnetic properties;   

DOI  :  10.1016/j.jmmm.2017.09.041

来源: Elsevier

【 摘 要 】

In this study, we investigate artifacts arising from electric charges present in magnetic force microscopy images. Therefore, we use two austenitic steel samples with different microstructural conditions. Furthermore, we examine the influence of the surface preparation, like etching, in magnetic force images. Using Kelvin probe force microscopy we can quantify the charges present on the surface. Our results show that electrical charges give rise to a signature in the magnetic force microscopy, which is indistinguishable from a magnetic signal. Our results on two differently aged steel samples demonstrate that the magnetic force microscopy images need to be interpreted with care and must be corrected due to the influence of electrical charges present. We discuss three approaches, how to identify these artifacts - parallel acquisition of magnetic force and electric force images on the same position, sample surface preparation to decrease the presence of charges and inversion of the magnetic polarization in two succeeding measurement. (C) 2017 Elsevier B.V. All rights reserved.

【 授权许可】

Free