Investigation of structural, magnetic and electronic properties of FeTa films for varying Ta concentration at different annealing temperatures

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS

卷:538

Article

Jafri, Yasmeen^1,2  Singh, Surendra^3,4  Gupta, Surbhi⁵  Fukuma, Yasuhiro⁵  Sharma, Kavita^1,2  Gupta, Mukul⁶  Reddy, V. R.⁶  Sharma, Gagan^1,2  Gupta, Ajay^1,7 

[1] Amity Univ UP, Amity Ctr Spintron Mat, Sect 125, Noida 201313, India

[2] Amity Univ UP, Amity Inst Appl Sci, Sect 125, Noida 201313, India

[3] Bhabha Atom Res Ctr, Div Solid State Phys, Mumbai 400085, Maharashtra, India

[4] Homi Bhabha Natl Inst, Mumbai 400094, Maharashtra, India

[5] Kyushu Inst Technol, Dept Phys & Informat Technol, Fac Comp Sci & Syst Engn, 680-4 Kawazu, Iizuka, Fukuoka 8208502, Japan

[6] UGC DAE Consortium Sci Res, Univ Campus,Khandwa Rd, Indore 452001, India

[7] Univ Petr & Energy Studies, Dept Phys, Dehra Dun 248007, Uttarakhand, India

关键词: PNR;    FMR;    SXAS;    Coercivity;    Magnetization;    XRD;   

DOI  :  10.1016/j.jmmm.2021.168306

来源: Elsevier

【 摘 要 】

In the present work, temperature dependent magnetic, structural and electronic properties of FeTa films with increasing Ta concentration are investigated. X-ray reflectivity (XRR) studies reveal densification of the film with increasing Ta concentration. Thermal annealing also results in an increased electron density relative to asdeposited film, concurrent with increase in grain size as observed from X-ray diffraction (XRD) and results of Soft-X-ray absorption spectroscopy (SXAS). However, grain growth is inhibited with increasing Ta concentration by presence of Ta in grain boundary (GB) region. This also results in increase in magnetic coercivity (greater than150 %) as observed from magneto-optical Kerr effect (MOKE). The structural properties were further correlated with magnetic properties as observed from Polarized neutron reflectivity (PNR) and Ferromagnetic resonance (FMR). Effective magnetic moment of the samples, as observed from PNR decreases with increasing Ta concentration and increases with increasing annealing temperature, which is in agreement with FMR results. Scattering length density profiles, observed from simultaneous fitting of XRR and PNR show presence of an oxide layer at surface, as also confirmed from SXAS measurements.

【 授权许可】

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