期刊论文详细信息
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 卷:440
Si/Fe flux ratio influence on growth and physical properties of polycrystalline β-FeSi2 thin films on Si(100) surface
Article; Proceedings Paper
Tarasov, I. A.1,2  Visotin, M. A.2,3  Aleksandrovsky, A. S.2,3  Kosyrev, N. N.2  Yakovlev, I. A.1,2  Molokeev, M. S.2,4  Lukyanenko, A. V.2,3  Krylov, A. S.2  Fedorov, A. S.2,4  Varnakov, S. N.1,2  Ovchinnikov, S. G.1,2,3 
[1] Siberian State Aerosp Univ, 31 Krasnoyarsky Rabochiy Ave, Krasnoyarsk 660014, Russia
[2] RAS, SB, KSC, Kirensky Inst Phys,Fed Res Ctr, Akad Gorodok 50,Bld 38, Krasnoyarsk 660036, Russia
[3] Siberian Fed Univ, Inst Engn Phys & Radioelect, Krasnoyarsk 660041, Russia
[4] Far Eastern State Transport Univ, Seryshev Str 47, Khabarovsk 680021, Russia
关键词: beta-FeSi2 iron disilicide;    Optical properties;    Reflection high-energy electron diffraction;    Raman spectroscopy;    ab initio calculation;   
DOI  :  10.1016/j.jmmm.2016.12.084
来源: Elsevier
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【 摘 要 】

This work investigates the Si/Fe flux ratio (2 and 0.34) influence on the growth of beta-FeSi2 polycrystalline thin films on Si(100) substrate at 630 degrees C. Lattice deformations for the films obtained are confirmed by X-ray diffraction analysis (XRD). The volume unit cell deviation from that of beta-FeSi2 single crystal are 1.99% and 1.1% for Si/Fe = 2 and Si/Fe = 0.34, respectively. Absorption measurements show that the indirect transition (similar to 0.704 eV) of the Si/Fe = 0.34 sample changes to the direct transition with a bandgap value of similar to 0.816 eV for the sample prepared at Si/Fe = 2. The absorption spectrum of the Si/Fe = 0.34 sample exhibits an additional peak located below the bandgap energy value with the absorption maximum of similar to 0.36 eV. Surface magneto-optic Kerr effect (SMOKE) measurements detect the ferromagnetic behavior of the beta-FeSi2 polycrystalline films grown at Si/Fe = 0.34 at T = 10 K, but no ferromagnetism was observed in the samples grown at Si/Fe = 2. Theoretical calculations refute that the cell deformation can cause the emergence of magnetization and argue that the origin of the ferromagnetism, as well as the lower absorption peak, is beta-FeSi2 stoichiometry deviations. Raman spectroscopy measurements evidence that the film obtained at Si/Fe flux ratio equal to 0.34 has the better crystallinity than the Si/Fe = 2 sample.

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