Core-level spectroscopy of the Ni/W(110) interface: Correlation of W interfacial core-level shifts with first-layer Ni phases

SURFACE SCIENCE

卷:602

Article

Riffe, D. M.¹  Franckowiak, R. T.¹  Shinn, N. D.²  Kim, B.^3,4  Kim, K. J.⁵  Kang, T. -H.⁴ 

[1] Utah State Univ, Dept Phys, Logan, UT 84322 USA

[2] Sandia Natl Labs, Albuquerque, NM 87185 USA

[3] POSTECH, Dept Phys, Pohang 790784, Kyungbuk, South Korea

[4] Pohang Accelerator Lab, Beamline Res Div, Pohang 790784, Kyungbuk, South Korea

[5] Konkuk Univ, Dept Phys, Seoul 143701, South Korea

关键词: bimetallic surfaces;    nickel;    soft X-ray photoelectron spectroscopy;    surface electronic structure;    tungsten;   

DOI  :  10.1016/j.susc.2008.04.022

来源: Elsevier

【 摘 要 】

We have measured W 4f(7/2) core-level photoemission spectra from W(110) in the presence of Ni overlayers, from similar to 0.2 to similar to 3 monolayers. Interfacial core-level shifts associated with first-layer Ni phases have been identified: -230 +/- 15 meV for the 1 x 1 pseudomorphic phase and -70 +/- 7 meV for the 7 x 1 close-packed commensurate phase. At higher Ni coverages the interfacial core-level shift is -100 +/- 10 meV. These shifts are analyzed using the partial-shift model of Nilsson et al. [Phys. Rev. B 38 (1988) 10357]; the analysis indicates that the difference in binding energies between the 1 x 1 and 7 x 1 phases has a large contribution from structural differences between the two phases. (C) 2008 Elsevier B.V. All rights reserved.

【 授权许可】

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