Radiation induced nanovoid shrinkage in Cu at room temperature: An in situ study

SCRIPTA MATERIALIA

卷:166

Article

Fan, C.¹  Sreekar, A. R. G.¹  Shang, Z.¹  Li, Jin¹  Li, M.²  Wang, H.^1,3  El-Azab, A.^1,4  Zhang, X.¹ 

[1] Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA

[2] Argonne Natl Lab, Nucl Engn Div, Argonne, IL 60439 USA

[3] Sch Elect & Comp Engn, W Lafayette, IN 47907 USA

[4] Purdue Univ, Sch Nucl Engn, W Lafayette, IN 47907 USA

关键词: Nanovoids;    In situ radiation;    Void shrinkage;    Stacking fault tetrahedron;    Phase-field modeling;   

DOI  :  10.1016/j.scriptamat.2019.02.046

来源: Elsevier

【 摘 要 】

Radiation induced void swelling is widely observed in a variety of metallic materials. Here, by using sputtering deposition technique, we have introduced faceted nanovoids into Cu films. In-situ Kr ion irradiation was subsequently performed at room temperature to investigate the evolution of nanovoids. Most nanovoids found to shrink gradually with increasing dose. Irradiation induced high-density vacancy clusters exist mostly in the form of stacking fault tetrahedrons. Phase field modeling reveales that void shrinkage arises from biased absorption of interstitials. These findings provide insights to the physical mechanisms of radiation response of nanovoids in metallic materials. (C) 2019 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

Free