Temperature-resistance sensor arrays for combinatorial study of phase transitions in shape memory alloys and metallic glasses

SCRIPTA MATERIALIA

卷:168

Article

Zheng, Juanjuan^1,2  Zhang, Haitao¹  Miao, Yucong¹  Chen, Shi²  Vlassak, Joost J.¹ 

[1] Harvard Univ, John A Paulson Sch Engn & Appl Sci, Cambridge, MA 02138 USA

[2] Huazhong Univ Sci & Technol, Sch Opt & Elect Informat, Wuhan 430074, Hubei, Peoples R China

关键词: Resistance-temperature sensor;    High-throughput characterization;    Shape memory alloy;    Metallic glass;    Glass forming ability;   

DOI  :  10.1016/j.scriptamat.2019.04.027

来源: Elsevier

【 摘 要 】

We have developed sensor arrays using a simple and inexpensive fabrication process to measure the electrical resistance of thin-film materials as a function of temperature and composition. The sensors are capable of characterizing materials from liquid-nitrogen temperature to approximately 900 K and are not limited by low sample conductivity. We demonstrate the sensitivity and accuracy of the technique by analyzing the phase evolution in Ti-Ni-Cu shape memory alloys and PdSi-based metallic glasses. For the latter, we find that the change in resistance on crystallization correlates with glass-forming ability. This observation may be useful in identifying good glass formers using high-throughput techniques. (C) 2019 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

Free