Thickness-dependent stabilization of tetragonal ZrO2 in oxidized zirconium

SCRIPTA MATERIALIA

卷:145

Article

Harlow, Wayne¹  Lang, Andrew C.¹  Demaske, Brian J.²  Phillpot, Simon R.²  Taheri, Mitra L.¹ 

[1] Drexel Univ, Dept Mat Sci & Engn, Philadelphia, PA 19104 USA

[2] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA

关键词: Oxidation;    Zirconium;    Transmission electron microscopy;    Precession electron diffraction;    Density functional theory;   

DOI  :  10.1016/j.scriptamat.2017.09.014

来源: Elsevier

【 摘 要 】

Here we describe a study on the effect of transmission electron microscopy sample preparation on the stability of the tetragonal ZrO2 phase, as determined by precession electron diffraction. It was found that sample thickness, and thus corresponding stress remaining within the sample, can significantly affect the percentage of tetragonal phase ZrO2 recorded in the oxide layers. The microscopy-based finding is complemented by density functional theory calculations, confirming that there exists a crossover in energy between the two phases that depends on compressive strain. These findings further confirm that the significant portion of tetragonal phase is the result of stress stabilization. (C) 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

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