3D characterization of partially recrystallized Al using high resolution diffraction contrast tomography

SCRIPTA MATERIALIA

卷:157

Article

Sun, Jun^1,2  Yu, Tianbo¹  Xu, Chaoling³  Ludwig, Wolfgang^4,5  Zhang, Yubin¹ 

[1] Tech Univ Denmark, Dept Mech Engn, DK-2800 Lyngby, Denmark

[2] Xnovo Technol, DK-4600 Koge, Denmark

[3] Linkoping Univ, Dept Management & Engn, SE-58183 Linkoping, Sweden

[4] ESRF, 6 Rue Jules Horowitz, F-38043 Grenoble, France

[5] Univ Lyon, MATEIS, INSA Lyon, UMR CNRS 5510, 7 Ave Jean Capelle, F-69621 Villeurbanne, France

关键词: Recrystallization;    3D reconstruction;    Schwartz-Saltykov analysis;    Electron backscattering diffraction (EBSD);    Aluminium;   

DOI  :  10.1016/j.scriptamat.2018.08.001

来源: Elsevier

【 摘 要 】

Synchrotron diffraction contrast tomography (DCT) is for the first time used to characterize recrystallized grains in partially recrystallized Al. The positions, orientations and 3D shapes of >900 recrystallized grains are reconstructed within a gauge volume. The results are compared with those obtained using electron backscattered diffraction based on a statistical analysis. It is found that recrystallized grains with size larger than 10 mu m, corresponding to similar to 98% of the total recrystallized volume of the sample, are well characterized by DCT. The advantages of DCT for recrystallization studies and new possibilities with DCT on new generation synchrotron sources are discussed. (C) 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

Free