Investigation of Kelvin probe force microscopy efficiency for the detection of hydrogen ingress by cathodic charging in an aluminium alloy

SCRIPTA MATERIALIA

卷:68

Article

Larignon, Celine¹  Alexis, Joel²  Andrieu, Eric¹  Lacroix, Loic²  Odemer, Gregory¹  Blanc, Christine¹ 

[1] Univ Toulouse, CIRIMAT, CNRS, UPS,INPT,ENSIACET, F-31030 Toulouse 4, France

[2] Univ Toulouse, ENIT, LGP, F-65016 Tarbes, France

关键词: Kelvin probe force microscopy (KFM);    Secondary ion mass spectroscopy (SIMS);    Hydrogen diffusion;    Aluminum alloys;   

DOI  :  10.1016/j.scriptamat.2012.11.026

来源: Elsevier

【 摘 要 】

Detecting and locating absorbed hydrogen in aluminium alloys is necessary for evaluating the contribution of hydrogen embrittlement to the degradation of the mechanical properties for corroded or cathodically hydrogen-charged samples. The capability of Kelvin probe force microscopy (KFM) to overcome this issue was demonstrated. Aluminium alloy samples were hydrogenated by cathodic polarization in molten salts (KHSO4/NaHSO4 center dot H2O). The presence of absorbed hydrogen was revealed; the affected zone depth was measured by secondary ion mass spectroscopy analyses and KFM measurements. (C) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

【 授权许可】

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