期刊论文详细信息
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 卷:286
Swift heavy ion-induced amorphization of CaZrO3 perovskite
Article; Proceedings Paper
Lang, Maik1  Zhang, Fuxiang1  Li, Weixing1  Severin, Daniel2  Bender, Markus2  Klaumuenzer, Siegfried3  Trautmann, Christina2  Ewing, Rodney C.1 
[1] Univ Michigan, Dept Earth & Environm Sci & Mat Sci & Engn, Ann Arbor, MI 48109 USA
[2] GSI Helmholtzzentrum Schwerionenforsch GmbH, D-64291 Darmstadt, Germany
[3] Helmholtz Zentrum Berlin Mat & Energie GmbH, Dept Spallat Forsch Neutronen, D-14109 Berlin, Germany
关键词: Swift heavy ion irradiation;    Perovskite;    X-ray diffraction;   
DOI  :  10.1016/j.nimb.2011.12.028
来源: Elsevier
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【 摘 要 】

Perovskite, ABO(3), structures are an important class of ceramics with a large variety of derivative structure-types (cubic, tetragonal, hexagonal, orthorhombic, and rhombohedral). Radiation damage in perovskites is of interest due to their potential as actinide waste forms and to understand radiation effects in uranium- and thorium-bearing phases. Powder CaZrO3 perovskite was irradiated with 940-MeV Au ions up to 1.5 x 10(13) ions/cm(2). Changes in the crystal structure were followed in situ as function of fluence by means of a sequence of X-ray diffraction (XRD) measurements. Ion-induced amorphization is evidenced by a decrease in diffraction intensity and an increase in diffuse scattering. Based on XRD measurements, as well as transmission electron microscopy (TEM), CaZrO3 is completely amorphized at a fluence of 1.5 x 1013 ions/cm(2). From the evolution of the integrated XRD-maxima intensities with fluence, the diameter of the amorphous tracks is estimated to be 6.0 +/- 0.6 nm, which is independently confirmed by bright-field TEM images: 6.7 +/- 0.4 nm. Changes in the positions of diffraction maxima may be caused by at least two processes. Broadening of the diffraction maxima is analyzed using a Williamson-Hall plot. Strain-induced broadening is the dominant process. (C) 2011 Elsevier B.V. All rights reserved.

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