Time-of-flight - Energy spectrometer for elemental depth profiling - Jyvaskyla design

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:337

Article

Laitinen, Mikko¹  Rossi, Mikko¹  Julin, Jaakko¹  Sajavaara, Timo¹ 

[1] Univ Jyvaskyla, Dept Phys, Jyvaskyla 40014, Finland

关键词: Ion beam analysis;    Time-of-flight;    ToF-ERDA;    Elemental depth profiling;    Timing gate;   

DOI  :  10.1016/j.nimb.2014.07.001

来源: Elsevier

【 摘 要 】

A new time-of-flight elastic recoil detection spectrometer has been built, and initially the main effort was focused in getting good timing resolution and high detection efficiency for light elements. With the ready system, a 154 Ps timing resolution was recorded for scattered 4.8 MeV He-4(2+) ions. The hydrogen detection efficiency was from 80% to 20% for energies from 100 keV to I MeV, respectively, and this was achieved by having an additional atomic layer deposited Al2O3 coating on the first timing detector's carbon foil. The data acquisition system utilizes an FPGA-card to time-stamp every time-of-flight and energy event with 25 ns resolution. The different origins of the background events in coincident time-of-flight-energy histograms have been studied and explained. The built system has proved to be able to routinely depth profile films thinner than 10 nm. (C) 2014 Elsevier B.V. All rights reserved.

【 授权许可】

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