Application of principal component analysis for improvement of X-ray fluorescence images obtained by polycapillary-based micro-XRF technique

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:402

Article; Proceedings Paper

Aida, S.¹  Matsuno, T.¹  Hasegawa, T.²  Tsuji, K.¹ 

[1] Osaka City Univ, Grad Sch Engn, Sumiyoshi Ku, 3-3-138 Sugimoto, Osaka 5588585, Japan

[2] Kyoto Univ, Inst Chem Res, Uji, Kyoto 6610011, Japan

关键词: Micro-XRF;    Principal component analysis;    Elemental mapping;    XRF imaging;   

DOI  :  10.1016/j.nimb.2017.03.123

来源: Elsevier

【 摘 要 】

Micro X-ray fluorescence (micro-XRF) analysis is repeated as a means of producing elemental maps. In some cases, however, the XRF images of trace elements that are obtained are not clear due to high background intensity. To solve this problem, we applied principal component analysis (PCA) to XRF spectra. We focused on improving the quality of XRF images by applying PCA. XRF images of the dried residue of standard solution on the glass substrate were taken. The XRF intensities for the dried residue were analyzed before and after PCA. Standard deviations of XRF intensities in the PCA-filtered images were improved, leading to clear contrast of the images. This improvement of the XRF images was effective in cases where the XRF intensity was weak. (C) 2017 Elsevier B.V. All rights reserved.

【 授权许可】

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