期刊论文详细信息
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 卷:382
A setup for transmission measurements of low energy multiply charged ions through free-standing few atomic layer films
Article; Proceedings Paper
Smejkal, V.1  Gruber, E.1  Wilhelm, R. A.2  Brandl, L.1  Heller, R.2  Facsko, S.2  Aumayr, F.1 
[1] TU Wien, Inst Appl Phys, Wiedner Hauptstr 8-10-E134, A-1040 Vienna, Austria
[2] Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, D-01328 Dresden, Germany
关键词: Highly charged ions;    Ion surface interaction;    Carbon nano membranes;    Ion charge loss;    Ion energy loss;   
DOI  :  10.1016/j.nimb.2016.01.023
来源: Elsevier
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【 摘 要 】

We report the design and testing of a setup for transmission measurements of multiply charged ions through free-standing films with a thickness of a few atomic layers. The investigation thereof can yield deeper insight into charge equilibration and pre-equilibrium stopping phenomena which can ultimately be used to specifically tailor and modify these materials. (C) 2016 Elsevier B.V. All rights reserved.

【 授权许可】

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