期刊论文详细信息
| NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 卷:382 |
| A setup for transmission measurements of low energy multiply charged ions through free-standing few atomic layer films | |
| Article; Proceedings Paper | |
| Smejkal, V.1  Gruber, E.1  Wilhelm, R. A.2  Brandl, L.1  Heller, R.2  Facsko, S.2  Aumayr, F.1  | |
| [1] TU Wien, Inst Appl Phys, Wiedner Hauptstr 8-10-E134, A-1040 Vienna, Austria | |
| [2] Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, D-01328 Dresden, Germany | |
| 关键词: Highly charged ions; Ion surface interaction; Carbon nano membranes; Ion charge loss; Ion energy loss; | |
| DOI : 10.1016/j.nimb.2016.01.023 | |
| 来源: Elsevier | |
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【 摘 要 】
We report the design and testing of a setup for transmission measurements of multiply charged ions through free-standing films with a thickness of a few atomic layers. The investigation thereof can yield deeper insight into charge equilibration and pre-equilibrium stopping phenomena which can ultimately be used to specifically tailor and modify these materials. (C) 2016 Elsevier B.V. All rights reserved.
【 授权许可】
Free
【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 10_1016_j_nimb_2016_01_023.pdf | 778KB |
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