A design for a pinhole scanning helium microscope

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:340

Article; Proceedings Paper

Barr, M.¹  Fahy, A.¹  Jardine, A.²  Ellis, J.²  Ward, D.²  MacLaren, D. A.³  Allison, W.²  Dastoor, P. C.¹ 

[1] Univ Newcastle, Ctr Organ Elect, Callaghan, NSW 2308, Australia

[2] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England

[3] Univ Glasgow, Dept Phys, Glasgow G12 8QQ, Lanark, Scotland

关键词: Helium atom scattering;    Helium atom microscopy;    Scanning helium microscope;    SHeM;   

DOI  :  10.1016/j.nimb.2014.06.028

来源: Elsevier

【 摘 要 】

We present a simplified design for a scanning helium microscope (SHeM) which utilises almost entirely off the shelf components. The SHeM produces images by detecting scattered neutral helium atoms from a surface, forming an entirely surface sensitive and non-destructive imaging technique. This particular prototype instrument avoids the complexities of existing neutral atom optics by replacing them with an aperture in the form of an ion beam milled pinhole, resulting in a resolution of around 5 microns. Using the images so far produced, an initial investigation of topological contrast has been performed. (C) 2014 Elsevier B.V. All rights reserved.

【 授权许可】

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