Characterization of compositional modifications in metal-organic frameworks using carbon and alpha particle microbeams

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:404

Article; Proceedings Paper

Paneta, V.¹  Fluch, U.²  Petersson, P.³  Ott, S.²  Primetzhofer, D.¹ 

[1] Uppsala Univ, Angstrom Lab, Dept Phys & Astron, Ion Phys Appl Nucl Phys, Uppsala, Sweden

[2] Uppsala Univ, Angstrom Lab, Dept Chem, Uppsala, Sweden

[3] KTH Royal Inst Technol, Sch Elect Engn, Dept Fus Plasma Phys, Stockholm, Sweden

关键词: Metal-organic frameworks;    Rutherford Backscattering Spectrometry;   

DOI  :  10.1016/j.nimb.2017.01.058

来源: Elsevier

【 摘 要 】

Zirconium-oxide based metal-organic frameworks (MOFs) were grown on p-type Si wafers. A modified linker molecule containing iodine was introduced by post synthetic exchange (PSE). Samples have been studied using Rutherford Backscattering Spectrometry (RBS) and Particle Induced X-ray Emission (PIXE) techniques, employing the 5 MV 15SDH-2 Pelletron Tandem accelerator at the Angstrom laboratory. The degree of post synthetic uptake of the iodine-containing linker has been investigated with both a broad beam and a focused beam of carbon and alpha particles targeting different kind of MOF crystals which were of similar to 1-10 mu m in size, depending on the linker used. Iodine concentrations in MOF crystallites were also measured by Nuclear Magnetic Resonance Spectroscopy (NMR) and are compared to the RBS results. In parallel to the ion beam studies, samples were investigated by Scanning Electron Microscopy (SEM) to quantify possible crystallite clustering, develop optimum sample preparation routines and to characterize the potential ion beam induced sample damage and its dependence on different parameters. Based on these results the reliability and accuracy of ion beam data is assessed. (C) 2017 Elsevier B.V. All rights reserved.

【 授权许可】

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