Characterization by APT and TEM of Xe nano-bubbles in CeO2

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:469

Article

Perrin-Pellegrino, Carine¹  Dumont, Myriam¹  Keita, Mohamed Fadel¹  Neisius, Thomas²  Mikaelian, Georges¹  Mangelinck, Dominique¹  Carlot, Gaelle³  Maugis, Philippe¹ 

[1] Aix Marseille Univ, Univ Toulon, IM2NP, CNRS, Marseille, France

[2] Federat Rech Sci Chim, Marseille, France

[3] CEA, DEN, Dept Etud Combustibles, Ctr Cadarache, F-13108 St Paul Les Durance, France

关键词: Defects;    Implantation;    Atom probe tomography;    Transmission electron microscopy;   

DOI  :  10.1016/j.nimb.2020.02.032

来源: Elsevier

【 摘 要 】

Only few experimental techniques are able to characterize the space and size distributions of gas-filled nanocavities embedded in ceramic matrices. The aim of the current paper is to point out the potentiality of atom probe tomography for this objective. Nano-clusters enriched in Xe are evidenced in 3-D reconstructed volumes in Xe-implanted CeO2. Their size and density are comparable to bubble populations observed by TEM.

【 授权许可】

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