EUV spectroscopy of highly charged xenon ions

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:235

Article; Proceedings Paper

Biedermann, C ; Radtke, R ; Fussmann, G ; Schwob, JL ; Mandelbaum, P

关键词: highly charged ions;    EBIT;    EUV-spectroscopy;    wavelength;    xenon;    plasma diagnostics;   

DOI  :  10.1016/j.nimb.2005.03.158

来源: Elsevier

【 摘 要 】

At the Berlin Electron Beam Ion Trap facility we investigated the radiation of highly charged xenon ions in the extreme ultraviolet wavelength range using a 2 in grazing incidence spectrometer. For Rb-like Xe17+ to Cu-like Xe25+ ions 37 individual lines have been registered in the range between 90 and 240 angstrom and identified by performing atomic structure calculations with the HULLAC code. The 4s-4p resonance lines of Cu-like and Zn-like Xe ions are found to be in good agreement with measurements at tokamaks and MCDF calculations. The experimental wavelengths for ions involving a larger number of electrons in the n = 4 shell deviate slightly from the predicted values. Several lines observed with the BerlinEBIT had been previously seen but not identified at the tokamak and can now be classified. (c) 2005 Elsevier B.V. All rights reserved.

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