期刊论文详细信息
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 卷:354
Low-energy ion scattering: A quantitative method?
Article
Goebl, D.1  Bruckner, B.1  Roth, D.1  Ahamer, C.1  Bauer, P.1 
[1] Johannes Kepler Univ Linz, Inst Expt Phys, Abt Atom & Oberflachenphys, A-4040 Linz, Austria
关键词: LEIS;    Surface composition analysis;    Information depth;    Matrix effects;   
DOI  :  10.1016/j.nimb.2014.11.030
来源: Elsevier
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【 摘 要 】

We explore under which conditions low-energy ion scattering experiments are capable of obtaining reliable quantitative results in surface composition analysis. Additionally, we elaborate on the effective information depth of this technique considering the effect of different dominant charge exchange mechanisms. Based on concrete examples, we also point out possible problems and pitfalls in the evaluation of experimental data. (C) 2014 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/3.0/).

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