LEIS: A reliable tool for surface composition analysis?

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:267

Article; Proceedings Paper

Primetzhofer, D.¹  Markin, S. N.¹  Juaristi, J. I.²  Taglauer, E.³  Bauer, P.¹ 

[1] Johannes Kepler Univ Linz, Inst Expt Phys, A-4040 Linz, Austria

[2] Fac Ciencias Quim, Dept Fis Mat, E-20080 San Sebastian, Spain

[3] EURATOM, Max Planck Inst Plasmaphys, D-85748 Garching, Germany

关键词: Low-energy ion scattering;    Single crystal;    Neutralization;    Cu(100);    Ag(111);    Ion fraction;   

DOI  :  10.1016/j.nimb.2008.10.050

来源: Elsevier

【 摘 要 】

Different single and polycrystalline surfaces of Cu and Ag have been investigated by time-of-flight low-energy ion scattering using (4)He(+) ions. The fraction of ions that survived single scattering from the outermost surface layers, P(+), was measured in different neutralization regimes. At low energies, a distinct difference in P(+) was observed for non-equivalent Cu crystal surfaces for projectiles backscattered in a single collision. The polycrystalline surface was found to exhibit similar neutralization behaviour as the (111) single crystal surface. At higher energies, P(+) shows a strong dependence on the angular orientation of the single crystal. The impact of these findings on quantitative surface composition analysis by LEIS is discussed. (C) 2008 Elsevier B.V. All rights reserved.

【 授权许可】

Free