NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 卷:475 |
Target K-shell X-ray emission associated with single and double electron capture for F9+, 8+,7+ + Ar collisions | |
Article | |
La Mantia, D. S.1  Kumara, P. N. S.1  Tanis, J. A.1  | |
[1] Western Michigan Univ, Kalamazoo, MI 49008 USA | |
关键词: Ions; Ion collisions; K shell; Ionization; Cross sections; | |
DOI : 10.1016/j.nimb.2020.04.027 | |
来源: Elsevier | |
【 摘 要 】
Cross sections for target Ar K-shell ionization associated with single and double electron capture, as well as the same cross sections corresponding to projectile F K X-rays and the total cross sections for single and double capture, were determined for 1.8-2.2 MeV/u F-9+,F-8+,F- 7+ projectiles. This work was performed at Western Michigan University using the tandem Van de Graaff accelerator. Coincidences between emitted X-rays and their corresponding charge-changed particles were detected. The Ar K X-ray coincidence cross section ratios for double to single capture are found to depend strongly on the incident charge state, with the ratios for F9+ well exceeding unity. Possible explanations for this anomalous behavior are discussed but a conclusive explanation is not found. The results are compared to previous experiments using fully-stripped fluorine where coincidence techniques were not employed.
【 授权许可】
Free
【 预 览 】
Files | Size | Format | View |
---|---|---|---|
10_1016_j_nimb_2020_04_027.pdf | 1142KB | download |