High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:238

Article; Proceedings Paper

Steuwer, A ; Santisteban, JR ; Turski, M ; Withers, PJ ; Buslaps, T

关键词: energy dispersive;    diffraction;    residual stress;    whole-pattern fitting;   

DOI  :  10.1016/j.nimb.2005.06.049

来源: Elsevier

【 摘 要 】

The feasibility of high-resolution strain mapping in bulk samples with both high-spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beam line ID15A at the ESRF. This was achieved by using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point strain uncertainty of 10(-5). The presented results have been validated with alternative methods, in this case FE model predictions. This technique promises to be a significant development in the in situ characterisation of strain fields around cracks in bulk engineering samples. The implication of slit size and grain size are discussed. This paper is a concise version of the work published in [A. Steuwer, J.R. Santisteban, M. Turski, P.J. Withers, T. Buslaps, J. Appl. Cryst. 37 (2004) 883]. (c) 2005 Elsevier B.V. All rights reserved.

【 授权许可】

Free