A generalized fitting tool for analysis of two-dimensional channeling patterns

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

卷:462

Article

David-Bosne, E.¹  Wahl, U.^1,2  Correia, J. G.¹  Lima, T. A. L.^2,3  Vantomme, A.^2,3  Pereira, L. M. C.^2,3 

[1] Univ Lisbon, Inst Super Tecn, Dept Engn & Ciencias Nucl, C2TN, P-2695066 Bobadela, Portugal

[2] Katholieke Univ Leuven, Inst Kern & Stralingsfys, B-3001 Leuven, Belgium

[3] Katholieke Univ Leuven, Quantum Solid State Phys, B-3001 Leuven, Belgium

关键词: Two-dimensional channeling pattern;    Blocking pattern;    Image scan;    Position-sensitive detector;    Fitting software;    RBS/C;    Emission channeling;   

DOI  :  10.1016/j.nimb.2019.10.029

来源: Elsevier

【 摘 要 】

The acquisition of two-dimensional (2D) channeling patterns is gaining increased popularity within the ion beam community. However, with the exception of emission channeling experiments for the lattice location of radioactive impurities, quantitative analysis of such patterns is rarely found. We present a general description of the statistical data analysis methodology for 2D channeling patterns, which consists of comparing experimental data by means of a fit procedure to theoretical yield distributions. The developed software allows for chi-square or maximum likelihood-based fits, optimizing the orientation of the theoretical vs the experimental pattern, as well as the best choice of random level, and providing fractions for the contributions from several theoretical patterns related to different lattice sites. Optionally also the angular resolution can be used as a fit parameter. Use of the software is illustrated by examples of electron emission channeling from Mg-27 in GaN, as well as He-4 RBS channeling from Ge.

【 授权许可】

Free