| THIN SOLID FILMS | 卷:591 |
| Integration of epitaxial Pb(Zr0.52Ti0.48)O3 films on GaN/AlGaN/GaN/Si(111) substrates using rutile TiO2 buffer layers | |
| Article | |
| Elibol, K.1  Nguyen, M. D.1,2,3  Hueting, R. J. E.1  Gravesteijn, D. J.1,4  Koster, G.1  Rijnders, G.1  | |
| [1] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands | |
| [2] SolMateS B V, NL-7522 NB Enschede, Netherlands | |
| [3] Hanoi Univ Sci & Technol, Int Training Inst Mat Sci, Hanoi 10000, Vietnam | |
| [4] NXP Semicond Res, NL-5656 AE Eindhoven, Netherlands | |
| 关键词: Lead zirconate titanate; Gallium nitride; Rutile titanium dioxide; Heterostructures; Thin film optimization; Structural properties; Ferroelectric properties; Pulsed laser deposition; | |
| DOI : 10.1016/j.tsf.2015.07.069 | |
| 来源: Elsevier | |
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【 摘 要 】
The integration of ferroelectric layers on gallium nitride (GaN) offers a great potential for various applications. Lead zirconate titanate (PZT), in particular Pb(Zr0.52Ti0.48)O-3, is an interesting candidate. For that a suitable buffer layer should be grown on GaN in order to prevent the reaction between PZT and GaN, and to obtain PZT with a preferred orientation and phase. Here, we study pulsed laser deposited (100) rutile titanium oxide (R-TiO2) as a potential buffer layer candidate for ferroelectric PZT. For this purpose, the growth, morphology and the surface chemical composition of R-TiO2 films were analyzed by reflection high-energy electron diffraction, atomic force microscopy, X-ray diffraction, and X-ray photoelectron spectroscopy. We find optimally (100) oriented R-TiO2 growth on GaN(0002) using a 675 degrees C growth temperature and 2 Pa O-2 deposition pressure as process conditions. More importantly, the R-TiO2 buffer layer grown on GaN/Si substrates prevents the unwanted formation of the PZT pyrochlore phase. Finally, the remnant polarization and coercive voltage of the PZT film on TiO2/GaN/Si with an interdigitated-electrode structure were found to be 25.6 mu C/cm(2) and 8.1 V, respectively. (C) 2015 Elsevier B.V. All rights reserved.
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| Files | Size | Format | View |
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| 10_1016_j_tsf_2015_07_069.pdf | 1618KB |
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