Structural and transport properties of La1-xSrxCo1-yNbyO3 thin films

THIN SOLID FILMS

卷:709

Article

Shukla, Rishabh¹  Kumar, Ajay¹  Dalal, Sandeep²  Pandey, Akhilesh²  Dhaka, R. S.¹ 

[1] Indian Inst Technol Delhi, Dept Phys, New Delhi 110016, India

[2] DRDO, Solid State Phys Lab, Lucknow Rd, Delhi 110054, India

关键词: Lanthanum Cobaltite;    Thin Films;    Raman modes;    Transport Properties;   

DOI  :  10.1016/j.tsf.2020.138250

来源: Elsevier

【 摘 要 】

We present the structural and transport properties of La1-xSrxCo1-yNbyO3 (y = 0.1 and x = 0; y = 0.15 and x = 0.3) thin films grown on [001] oriented single crystalline ceramic substrates to investigate the effect of lattice induced compressive and tensile strain. The high resolution X-ray diffraction measurements, including theta-2 theta scan, Phi-scan, and reciprocal space mapping, affirm single phase; four-fold symmetry; good quality of deposited thin films. The atomic force micrographs confirm that these films have small root mean square roughness in the range of similar to 0.5-7 nm. We observed additional Raman active modes in the films owing to the lowered crystal symmetry as compared to the bulk. More interestingly, the temperature dependent dc-resistivity measurements reveal that films become insulating due to induced lattice strain in comparison to bulk, however for the larger compressive strained films conductivity increase significantly owing to the higher degree of p - d hybridization and reduction in bandwidth near the Fermi level.

【 授权许可】

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