Characterization of thermal oxide films formed on a duplex stainless steel by means of confocal-Raman microscopy and electrochemical techniques

THIN SOLID FILMS

卷:576

Article

Sanchez-Tovar, R.¹  Leiva-Garcia, R.^1,2  Garcia-Anton, J.¹ 

[1] Univ Politecn Valencia, Dept Ingn Quim & Nucl, E-46022 Valencia, Spain

[2] Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England

关键词: Stainless steel;    Electrochemical impedance spectroscopy;    Raman spectroscopy;    Confocal laser microscopy;    Oxidation;    Passivation;   

DOI  :  10.1016/j.tsf.2014.12.024

来源: Elsevier

【 摘 要 】

In this work oxide films have been developed on the surface of a duplex stainless steel (UNS 1.4462) using high temperature confocal microscopy to follow their growth. The characteristics of these oxide films have been analyzed by means of weight-gain measurements, Raman microscopy and electrochemical techniques, namely potentiodynamic polarization curves and electrochemical impedance spectroscopy. The results showan increase in the amount of oxides (particularly gamma-Fe2O3 and Fe3O4) with temperature. Regarding the electrochemical properties of these films, the corrosion resistance of the film tends to be lower with the heat treatment temperature, probably due to a more porous and heterogeneous scale. Mott-Schottky plots show the n-type semiconductive behavior of the films with donor densities that decrease with the enhancement of the temperature. (C) 2014 Elsevier B.V. All rights reserved.

【 授权许可】

Free