Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration

THIN SOLID FILMS

卷:571

Article; Proceedings Paper

Lohner, T.¹  Agocs, E.¹  Petrik, P.^1,2  Zolnai, Z.¹  Szilagyi, E.³  Kovacs, I.³  Szokefalvi-Nagy, Z.³  Toth, L.¹  Toth, A. L.¹  Illes, L.¹  Barsony, I.^1,2 

[1] Hungarian Acad Sci, Res Ctr Nat Sci, Inst Tech Phys & Mat Sci, H-1121 Budapest, Hungary

[2] Univ Pannonia, Fac Informat Technol, Doctoral Sch Mol & Nanotechnol, H-8200 Veszprem, Hungary

[3] Hungarian Acad Sci, Wigner Res Ctr Phys, Inst Particle & Nucl Phys, H-1121 Budapest, Hungary

关键词: Ellipsometry;    Ion beam analysis;    Ag;    Metallic lustre;    Glaze;    PIXE;    RBS;   

DOI  :  10.1016/j.tsf.2013.11.055

来源: Elsevier

【 摘 要 】

In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements. (C) 2013 Elsevier B.V. All rights reserved.

【 授权许可】

Free