Optical Mueller matrix modeling of chiral AlxIn1 - xN nanospirals

THIN SOLID FILMS

卷:571

Article; Proceedings Paper

Magnusson, Roger¹  Birch, Jens¹  Sandstrom, Per¹  Hsiao, Ching-Lien¹  Arwin, Hans¹  Jarrendahl, Kenneth¹ 

[1] Linkoping Univ, Dept Phys Chem & Biol, SE-58183 Linkoping, Sweden

关键词: Chiral nanostructures;    Mueller matrix spectroscopic ellipsometry;    Anisotropy;    Optical modeling;    High degree of circular polarization;   

DOI  :  10.1016/j.tsf.2014.02.015

来源: Elsevier

【 摘 要 】

Metamaterials in the form of chiral nanostructures have shown great potential for applications such as chemical and biochemical sensors and broadband or wavelength tunable circular polarizers. Here we demonstrate a method to produce tailored transparent chiral nanostructures with the wide-bandgap semiconductor AlxIn1 (-) N-x. A series of anisotropic and transparent films of AlxIn1 (-) N-x were produced using curved-lattice epitaxial growth on metallic buffer layers. By controlling the sample orientation during dual magnetron sputter deposition, nanospirals with right-handed or left-handed chirality were produced. Using a dual rotating compensator ellipsometer in reflection mode, the full Mueller matrix was measured in the spectral range 245-1700 nm at multiple angles of incidence. The samples were rotated one full turn around their normal during measurements to provide a complete description of the polarization properties in all directions. For certain wavelengths, unpolarized light reflected off these films becomes highly polarized with a polarization state close to circular. Nanostructured films with right-and left-handed chirality produce reflections with right- and left-handed near-circularly polarized light, respectively. A model with a biaxial layer in which the optical axes are rotated from bottom to top was fitted to the Mueller-matrix data. Hence we can perform non-destructive structural analysis of the complex thin layers and confirm the tailored structure. In addition, the refractive index, modeled with a biaxial Cauchy dispersion model, is obtained for the AlxIn1 (-) N-x films. (C) 2014 The Authors. Published by Elsevier B.V.

【 授权许可】

Free