CRYSTAL-GROWTH AND STRUCTURE OF FULLERENE THIN-FILMS

THIN SOLID FILMS

卷:257

Article

关键词: ATOMIC FORCE MICROSCOPY;    ELECTRON MICROSCOPY;    EPITAXY;    MOLECULAR BEAM EPITAXY;   

DOI  :  10.1016/0040-6090(94)05702-8

来源: Elsevier

【 摘 要 】

The growth and structure of C-60 and C-70 thin film crystals on alkali halide and layered material substrates are described. It is demonstrated that fairly large grains can be grown with the specific orientation to the substrate lattice, especially on layered substrates. The defects in the films fabricated on alkali halides are studied by transmission electron microscopy in detail. The growth mechanism of C-60 and C-70 thin films on these substrates is discussed on a basis of reflection high-energy electron diffraction and atomic force microscopy observation and compared with that on other substrates. The unusual growth characteristics of C-60 and C-70 are discussed and compared with those encountered in thin films of conventional van der Waals crystals.

【 授权许可】

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