| THIN SOLID FILMS | 卷:494 |
| Nanocrystalline growth and grain-size effects in Au-Cu electrodeposits | |
| Article; Proceedings Paper | |
| Jankowski, AF ; Saw, CK ; Harper, JF ; Vallier, BF ; Ferreira, JL ; Hayes, JP | |
| 关键词: nanostructures; growth mechanism; structural properties; deposition process; | |
| DOI : 10.1016/j.tsf.2005.08.149 | |
| 来源: Elsevier | |
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【 摘 要 】
The processing-structure-property relationship is investigated for electrodeposited foils of the gold-copper alloy system. A model is presented that relates the deposition process parameters to the nanocrystalline grain size. An activation energy of 1.52 eV atom(-1) for growth is determined for a long-pulse (> 10 msec) mode, and is 0.16 eV atom(-1) for short pulses (< 5 msec). The effect of nanocrystalline grain size on the mechanical properties is assessed using indentation measurements. A Hall-Petch type variation of the Vickers microhardness with nanocrystalline grain size (> 6 nm) is observed for Au-Cu samples with 1-12 wt.% Cu as tested in cross-section. The hardness increases three-fold from a rule-of-mixtures value <1 GPa to a maximum of 2.9 GPa. (c) 2005 Elsevier B.V. All rights reserved.
【 授权许可】
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【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 10_1016_j_tsf_2005_08_149.pdf | 233KB |
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