期刊论文详细信息
THIN SOLID FILMS 卷:598
Improvement of the effective work function and transmittance of thick indium tin oxide/ultrathin ruthenium doped indium oxide bilayers as transparent conductive oxide
Article
Taweesup, Kattareeya1  Yamamoto, Ippei2  Chikyow, Toyohiro2  Lothongkum, Gobboon1  Tsukagoshi, Kazutoshi2  Ohishi, Tomoji3  Tungasmita, Sukkaneste4  Visuttipitukul, Patama1  Ito, Kazuhiro5  Takahashi, Makoto5  Nabatame, Toshihide2,6 
[1] Chulalongkorn Univ, Fac Engn, Dept Met Engn, Bangkok 10330, Thailand
[2] Natl Inst Mat Sci NIMS, Int Ctr Mat Nanoarchitecton WTI MANA, Tsukuba, Ibaraki 3050044, Japan
[3] Shibaura Inst Technol, Koto Ku, Tokyo 1358548, Japan
[4] Chulalongkorn Univ, Dept Phys, Fac Sci, Bangkok 10330, Thailand
[5] Osaka Univ, Joining & Welding Res Inst, Ibaraki, Osaka 5670047, Japan
[6] Japan Sci & Technol Agcy, CREST, Kawaguchi, Saitama 3320012, Japan
关键词: Ruthenium;    Doped indium oxide;    Transparent conductive oxide;    Effective work function;    Indium tin oxide;    Bilayers;   
DOI  :  10.1016/j.tsf.2015.11.070
来源: Elsevier
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【 摘 要 】

Ruthenium doped indiumoxide (In1-xRuxOy) films fabricated using DC magnetron co-sputtering with In2O3 and Ru targets were investigated for use as transparent conductive oxides. The In1-xRuxOy films had an amorphous structure in the wide compositional range of x = 0.3-0.8 and had an extremely smooth surface. The transmittance and resistivity of the In1-xRuxOy films increased as the Ru content increased. The transmittance of the In0.38Ru0.62Oy film improved to over 80% when the film thickness was less than 5 nm, while the specific resistivity (rho) was kept to a low value of 1.6 x 10(-4) Omega cm. Based on these experimental data, we demonstrated that thick indium tin oxide (In0.9Sn0.1Oy, ITO) (150 nm)/ultrathin In0.38Ru0.62Oy (3 nm) bilayers have a high effective work function of 5.3 eV, transmittance of 86%, and low rho of 9.2 x 10(-5) Omega cm. This ITO/In0.38Ru0.62Oy bilayer is a candidate for use as an anode for organic electroluminescent devices. (C) 2015 Elsevier B.V. All rights reserved.

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