Effects of piezo-spectroscopic coefficients of 8 wt.% Y2O3 stabilized ZrO2 on residual stress measurement of thermal barrier coatings by Raman spectroscopy

SURFACE & COATINGS TECHNOLOGY

卷:204

Article

Mao, W. G.^1,2  Chen, Q.^1,2  Dai, C. Y.^1,2  Yang, L.^1,3  Zhou, Y. C.^1,2  Lu, C.⁴ 

[1] Xiangtan Univ, Fac Mat Optoelect & Phys, Xiangtan 411105, Hunan, Peoples R China

[2] Xiangtan Univ, Minist Educ, Key Lab Low Dimens Mat & Applicat Technol, Xiangtan 411105, Hunan, Peoples R China

[3] Beijing Inst Technol, State Key Lab Explos Sci & Technol, Beijing 100081, Peoples R China

[4] Curtin Univ Technol, Dept Mech Engn, Perth, WA 6845, Australia

关键词: Thermal barrier coating;    Piezo-spectroscopic coefficient;    Raman spectroscopy;    Residual stress;   

DOI  :  10.1016/j.surfcoat.2010.04.024

来源: Elsevier

【 摘 要 】

By using specially designed freestanding 8 wt.% Y2O3 stabilized ZrO2 (8YSZ) specimens, a linear relationship is found between the Raman peak shift, Delta omega, and applied uniaxial compressive stress, (sigma) over bar (u), i.e., Aro=11,A, with r1u being the piezo-spectroscopic coefficient. The linear relationship is used to determine the in-plane residual stress in air plasma-sprayed 8YSZ thermal barrier coatings (TBCs). It is shown that the Pi(u) of the 8YSZ is an exponential function of the thermal cycle N for a given thermal cycling process: Pi(u)=37.6exp (N/25.9)+13. Based on these two relationships, the actual residual stress of 8YSZ TBCs determined by the Raman spectroscopy method is quantitatively consistent with that obtained by the X-ray diffraction. (C) 2010 Elsevier B.V. All rights reserved.

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