Surface plasmon resonance enhanced ellipsometric analysis for monitoring of cobalt electrochemical reaction in solution

SENSORS AND ACTUATORS B-CHEMICAL

卷:181

Article

Wang, Zhenzhen^1,2  Liu, Wei³  Wang, Chunxia¹  Kan, Qiang¹  Chen, She³  Chen, Hongda¹ 

[1] Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China

[2] Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China

[3] Chinese Acad Sci, Inst Mech, Dept Natl Micrograv Lab, Beijing 100083, Peoples R China

关键词: Surface plasmon resonance;    Ellipsometry;    Ion selective electrode;    Image contrast;   

DOI  :  10.1016/j.snb.2013.01.044

来源: Elsevier

【 摘 要 】

Cobalt-based ion selective electrode (ISE) is one of the key methods for phosphate detection. In this paper, surface plasmon resonance (SPR) enhanced ellipsometric analysis method has been used to monitor the electrochemical reaction process at Co ISE sensor surface and the mass consumption of sensitive electrode membranes. An Au-Co bilayer film is designed as optical detection interface. In order to obtain detectable reflection intensity variation with Co thickness, Au film and Co film thickness are optimized at TM polarization state. According to the calculation results, 50 nm Au film is formed on glass substrate by electron beam evaporation. Then cobalt film with thickness of about 20 nm is grown on gold film by electrochemical deposition method. Ellipsometric measurements were performed at SPR angle 59. The consuming process of Co film reacting with dissolved oxygen in deionized water has been obtained by monitoring the change of reflection intensity. (C) 2013 Elsevier B.V. All rights reserved.

【 授权许可】

Free