Refractive index change measurement by quantitative microscopy phase imaging for femtosecond laser written structures

OPTICS COMMUNICATIONS

卷:485

Article

Abou Khalil, Alain¹  Gebremichael, Wendwesen¹  Petit, Yannick¹  Canioni, Lionel¹ 

[1] Univ Bordeaux, CNRS, CEA, CELIA,UMR 5107, F-33405 Talence, France

关键词: Quantitative phase imaging;    Refractive index change;    Femtosecond laser writing;   

DOI  :  10.1016/j.optcom.2020.126731

来源: Elsevier

【 摘 要 】

Quantitative phase imaging has been widely exploited and developed during the last decade. This technique is efficient, allowing for quantitative and qualitative spatially resolved measurements of the refractive index profiles. However, there are some measurement limitations for thick samples when exceeding the depth of field-of-view of the imaging system. In this paper, we present an approach based on the complete Rayleigh-Sommerfeld diffraction theory, which allows quantitative retrieve of the refractive index change from the measured optical path difference, especially in the case of thick samples. This approach is validated by a comparison with experimental measurements of refractive index changes of distinct series of cylindrically shaped volume modifications inscribed by femtosecond laser irradiation in silica glass. The results presented hereby, enable quantitative measurement of refractive index change for thick embedded 3D structures.

【 授权许可】

Free