Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization

OPTICS COMMUNICATIONS

卷:498

Article

Gomez-Mendez, Gustavo A.¹  Martinez-Garcia, Amalia²  Serrano-Garcia, David I.³  Rayas-Alvarez, Juan Antonio²  Perez, Areli Montes⁴  Islas-Islas, Juan M.¹  Toto-Arellano, Noel Ivan¹ 

[1] Univ Tecnol Tulancingo, Cuerpo Acad Ingn Ciencias & Innovac Tecnol, Hgo 43645, Mexico

[2] Ctr Invest Opt AC, Leon 37150, Gto, Mexico

[3] Guadalajara Univ, Univ Ctr Exact Sci & Engn CUCEI, Guadalajara 44430, Jalisco, Mexico

[4] Benemerita Univ Autonoma Puebla, Fac Ciencias Fisicomatemat, Puebla 72592, Pue, Mexico

关键词: Electronic speckle pattern interferometry;    Optical metrology;    Phase shifting;    In-plane displacement;    interferometry;   

DOI  :  10.1016/j.optcom.2021.127245

来源: Elsevier

【 摘 要 】

We propose to combine electronic speckle pattern interferometry with polarizing phase-shifting techniques to measure in-plane displacement fields. We present the technical and theoretical procedures for its implementa-tion, added with the necessary calibration procedures employing a commercial polarimeter. Finally, we tested our proposal experimentally using a two-phase step algorithm to measure in-plane displacements on a latex sample.

【 授权许可】

Free