Identification of acquisition parameters from the point spread function of a fluorescence microscope

OPTICS COMMUNICATIONS

卷:196

Article

Haeberlé, O ; Bicha, F ; Simler, C ; Dieterlen, A ; Xu, C ; Colicchio, B ; Jacquey, S ; Gramain, MP

关键词: point spread function;    microscopy;    deconvolution;    system identification;   

DOI  :  10.1016/S0030-4018(01)01376-1

来源: Elsevier

【 摘 要 】

Except for blind methods, deconvolution of 3-D data sets acquired from a fluorescence microscope requires the knowledge of the point spread function (PSF) of the instrument. Using the XCOSM package, we show first with simulations and then with recorded data that it is possible to recover from an experimental PSF some parameters, which are very difficult or impossible to measure during the acquisition, like the specimen depth or the immersion medium refractive index. Doing so, we can precise the acquisition protocol, which helps to use the instrument under optimal conditions. Furthermore, the knowledge of the actual acquisition conditions permits to use for the deconvolution process a computed PSF, which is noiseless and as close as possible to the actual PSF. This helps to reduce errors in quantitative measurements after deconvolution, as shown with computations. (C) 2001 Elsevier Science B.V. All rights reserved.

【 授权许可】

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