| OPTICS COMMUNICATIONS | 卷:399 |
| Effective optical properties of supported silicon nanopillars at telecommunication wavelengths | |
| Article | |
| Perez-Chavez, V.1  Simonsen, I.2,3  Maradudin, A. A.4  Blaize, S.5  Mendez, E. R.1  | |
| [1] Ctr Invest Cient & Educ Super Ensenada, Div Fis Aplicada, Carretera Ensenada Tijuana 3918, Ensenada 22860, BC, Mexico | |
| [2] NTNU Norwegian Univ Sci & Technol, Dept Phys, NO-7491 Trondheim, Norway | |
| [3] CNRS St Gobain, UMR 125, Surface Verre & Interfaces, F-93303 Aubervilliers, France | |
| [4] Univ Calif Irvine, Dept Phys & Astron, Irvine, CA 92697 USA | |
| [5] Univ Technol Troyes, Lab Nanotechnol & Instrumentat Opt, 12 Rue Marie Curie,BP-2060, F-10010 Troyes, France | |
| 关键词: Silicon photonics; Effective medium theory; Transformation optics; Optical metamaterials; High index dielectrics; Light scattering; | |
| DOI : 10.1016/j.optcom.2017.04.027 | |
| 来源: Elsevier | |
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【 摘 要 】
We measure and calculate the optical response of a structure consisting of a square array of subwavelength silicon posts on a silicon substrate at telecommunication wavelengths. By the use of the reduced Rayleigh equations and the Fourier modal method ( rigorous coupled wave analysis) we calculate the reflectivity of this structure illuminated from vacuum by normally incident light. The calculated reflectivities together with experimentally determined ones, are used to test the accuracy of effective medium theories of the optical properties of structured silicon surfaces, and to estimate the effective refractive index of such surfaces produced by a homogeneous layer model.
【 授权许可】
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【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 10_1016_j_optcom_2017_04_027.pdf | 960KB |
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