| OPTICS COMMUNICATIONS | 卷:458 |
| Dual wavelength digital holographic imaging of layered structures | |
| Article | |
| Khoo, Ting Chean1  Sharikova, Anna1  Khmaladze, Alexander1  | |
| [1] SUNY Albany, Phys Dept, 1400 Washington Ave, Albany, NY 12222 USA | |
| 关键词: Digital holography; Microscopy; Phase imaging; Phase reconstruction; | |
| DOI : 10.1016/j.optcom.2019.124793 | |
| 来源: Elsevier | |
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【 摘 要 】
We present a dual wavelength digital holographic technique for three-dimensional microscopic imaging of layered structures, where layers are separated from one another by the axial distances exceeding the wavelength of imaging light. Our methodology not only provides the three-dimensional structure of each layer, but also allows the height differentiation of distinct layers. We have also implemented a technique suppressing low intensity signal when no reliable phase information can be extracted, based on the quality of the interference fringe pattern. We utilize a dual wavelength setup, where the combination of two overlapping interferometers enables simultaneous acquisition of two phase profiles. We demonstrate that this imaging modality is particularly well-suited for imaging of multilayered electrode structures embedded in glass.
【 授权许可】
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【 预 览 】
| Files | Size | Format | View |
|---|---|---|---|
| 10_1016_j_optcom_2019_124793.pdf | 2402KB |
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