Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti-6Al-4V alloy

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

卷:528

Article

Castany, P.^1,2  Legros, M.² 

[1] INSA Rennes, UMR CNRS SCR Chim Met 6226, F-35708 Rennes 7, France

[2] CEMES CNRS, F-31055 Toulouse 4, France

关键词: In situ straining;    Transmission electron microscopy (T'EM);    Focused ion beam (FIB);    Dislocation dynamics;    Titanium alloy;    Nitridation;   

DOI  :  10.1016/j.msea.2010.10.025

来源: Elsevier

【 摘 要 】

The in situ tensile straining of cross-sectional specimens inside a TEM is intrinsically very difficult to perform despite its obvious interest to study interfaces of surface treated materials. We have combined a FIB-based method to produce H-bar specimens of a nitrided Ti-6Al-4V alloy and in situ TEM straining stage, to successfully study the plastic deformation mechanisms that are activated close to the nitrided surface in the Ti-based alloy. (C) 2010 Elsevier B.V. All rights reserved.

【 授权许可】

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