Measuring the Flex Life of Conductive Yarns in Narrow Fabric

Engineering Proceedings

article

Paula Veske¹  Frederick Bossuyt¹  Filip Thielemans¹  Jan Vanfleteren¹ 

[1]Centre for Microsystems Technology ,(CMST), Interuniversity Microelectronics Centre ,(IMEC), Ghent University

关键词: wearables;    e-textiles;    electronics;    testing;    reliability;   

DOI  :  10.3390/engproc2023030003

来源: mdpi

【 摘 要 】

The current work presents a testing machine built from off-the-shelf components to test for conductive yarns’ (or textiles’) durability to repeated bending that can occur during general wear-and-tear or domestic washing procedures. The testing method is explained with an example and results, comparing two different conductive yarns weaved into polyester-based narrow fabric.

【 授权许可】

Unknown