期刊论文详细信息
IEICE Electronics Express | |
Data BER analysis of OAM-assisted physical layer authentication system | |
article | |
Tao Hu1  Bowei Zhang1  Kuo Zhao1  Yang Wang2  Jie Zhang3  | |
[1] School of Communication Engineering, Chongqing College of Electronic Engineering;School of Communication and Information Engineering, Chongqing University of Posts and Telecommunications;Department of Electronic and Electrical Engineering, The University of Sheffield | |
关键词: bit error rate of data signal; orbital angular momentum; physical layer authentication; Rician fading channel; | |
DOI : 10.1587/elex.19.20220434 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
The bit error rate of data signal (data BER) of a key-based physical layer authentication (PLA) scheme suffers from a non-negligible performance loss, mainly caused by the authentication tags taking power from data symbols and interfering with the data demodulation. Considering the orthogonality among different orbital angular momentum (OAM) modes, in this paper, an OAM-assisted PLA (OAM-PLA) scheme is proposed to improve the performance of data BER. The data BER of the proposed OAM-PLA scheme over the Rician fading channel has better performance than the conventional PLA scheme.
【 授权许可】
CC BY
【 预 览 】
Files | Size | Format | View |
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RO202306290004543ZK.pdf | 4519KB | download |