A dV/dt noise canceling circuit of capacitive-isolated gate drivers

IEICE Electronics Express

article

Xuefei Zhang¹  Tiantian Liu¹  Yuhua Quan¹  Xiaoyi Huang¹  Xinhong Cheng¹  Yuehui Yu¹ 

[1] The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences;The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences

关键词: capacitive-isolated gate driver;    CMTI;    propagation delay;   

DOI  :  10.1587/elex.19.20220338

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

For capacitive-isolated gate drivers, the pulse width distortion (PWD) and common mode transient immunity (CMTI) are vital factors to evaluate its performance. In this paper, an envelope detection circuit and a dV/dt noise canceling circuit of capacitive-isolated gate drivers is designed based on X-FAB 0.35µm CMOS process. With these structures, this gate driver alleviates PWD and improve CMTI. Spectre simulation results show that the gate driver achieves 200kV/µs CMTI with 50ns propagation delay and maximum 7.4ns PWD. Besides, it has better robustness to fabrication process and temperature variation than conventional methods.

【 授权许可】

CC BY