Accurate spectral testing algorithm of ADC with amplitude drift

IEICE Electronics Express

article

Jiangduo Fu¹  Zhong Yang¹  Jiayin Song¹  Shushan Qiao¹ 

[1] Institute of Microelectronics of Chinese Academy of Sciences;University of Chinese Academy of Sciences

关键词: analog-to-digital converter;    spectral leakage;    amplitude drift;    least square method;   

DOI  :  10.1587/elex.19.20220116

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

A new spectral testing algorithm is proposed to estimate the dynamic parameters accurately when the signal source suffers the amplitude drift. The output data of the Analog-to-Digital Converter (ADC) under test are divided into several segments. By estimating original fundamental via the Least squares method and reconstructing a non-drift fundamental to replace it, the new data are reconstructed without amplitude drift and hence the spectral leakage is removed. Extensive simulation results and algorithm analysis validate the functionality and robustness of the proposed method. The comparison with other state-of-the-art methods is also presented. The proposed algorithm relaxes the stringent requirement of the test environment, and reduces the test cost significantly.

【 授权许可】

CC BY