Eigenmodes of a quartz tuning fork and their application to photoinduced force microscopy

Article

关键词: EXCITATION;    NANOSCALE;    SYSTEMS;    PROBE;    FIELD;   

DOI  :  10.1103/PhysRevB.95.075440

来源: SCIE

【 摘 要 】

We examine the mechanical eigenmodes of a quartz tuning fork (QTF) for the purpose of facilitating its use as a probe for multifrequency atomic force microscopy (AFM). We perform simulations based on the three-dimensional finite element method and compare the observed motions of the beams with experimentally measured resonance frequencies of two QTF systems. The comparison enabled us to assign the first seven asymmetric eigenmodes of the QTF. We also find that a modified version of single beam theory can be used to guide the assignment of mechanical eigenmodes of QTFs. The usefulness of the QTF for multifrequency AFM measurements is demonstrated through photoinduced force microscopy measurements. By using the QTF in different configurations, we show that the vectorial components of the photoinduced force can be independently assessed and that lateral forces can be probed in true noncontact mode.

【 授权许可】

Free