Making angle-resolved photoemission measurements on corrugated monolayer crystals: Suspended exfoliated single-crystal graphene | |
Article | |
关键词: ELECTRONIC-STRUCTURE; DIRAC FERMIONS; GRAPHITE; SPECTROSCOPY; MICROSCOPY; SURFACES; DIFFRACTION; SCATTERING; DYNAMICS; DISORDER; | |
DOI : 10.1103/PhysRevB.84.115401 | |
来源: SCIE |
【 摘 要 】
Free-standing exfoliated monolayer graphene is an ultrathin flexible membrane, which exhibits out-of-plane deformation or corrugation. In this paper, a technique is described to measure the band structure of such free-standing graphene by angle-resolved photoemission. Our results show that photoelectron coherence is limited by the crystal corrugation. However, by combining surface morphology measurements of the graphene roughness with angle-resolved photoemission, energy-dependent quasiparticle lifetime and band-structure measurements can be extracted. Our measurements rely on our development of an analytical formulation for relating the crystal corrugation to the photoemission linewidth. Our angle-resolved photoemission spectroscopy measurements show that, despite significant deviation from planarity of the crystal, the electronic structure of exfoliated suspended graphene is nearly that of ideal, undoped graphene; we measure the Dirac point to be within 25 meV of E-F. Further, we show that suspended graphene behaves as a marginal Fermi liquid, with a quasiparticle lifetime that scales as (E - E-F)(-1); comparison with other graphene and graphite data is discussed.
【 授权许可】
Free