Thickness and electric-field-dependent polarizability and dielectric constant in phosphorene

Article

关键词: BLACK PHOSPHORUS;    MONOLAYER;    STRAIN;    PERMITTIVITY;    ANISOTROPY;    INSULATOR;    ORDER;    MOS2;   

DOI  :  10.1103/PhysRevB.93.195428

来源: SCIE

【 摘 要 】

Based on extensive first-principles calculations, we explore the thickness-dependent effective dielectric constant and slab polarizability of few-layer black phosphorene. We find that the dielectric constant in ultrathin phosphorene is thickness-dependent and it can be further tuned by applying an out-of-plane electric field. The decreasing dielectric constant with reducing number of layers of phosphorene is a direct consequence of the lower permittivity of the outer layers and the increasing surface-to-volume ratio. We also show that the slab polarizability depends linearly on the number of layers, implying a nearly constant polarizability per phosphorus atom. Our calculation of the thickness-and electric-field-dependent dielectric properties will be useful for designing and interpreting transport experiments in gated phosphorene devices, wherever electrostatic effects such as capacitance and charge screening are important.

【 授权许可】

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